Atomic assembly of Cu/Ta multilayers: Surface roughness, grain structure, misfit dislocations, and amorphization
نویسندگان
چکیده
misfit dislocations, and amorphization M. F. Francis, M. N. Neurock, X. W. Zhou, J. J. Quan, H. N. G. Wadley, and Edmund B. Webb III Chemical Engineering Department, University of Virginia, Charlottesville, Virginia 22904, USA Mechanics of Materials Department, Sandia National Laboratories, Livermore, California 94550, USA Seagate Technology, Bloomington, Minnesota 55435, USA Materials Science and Engineering Department, University of Virginia, Charlottesville, Virginia 22904, USA Computational Materials Science and Engineering Department, Sandia National Laboratories, Albuquerque, New Mexico 87185, USA
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